Publications

Private Publications:

A. Last, Arndts Faltverkleidung - Nicht nass werden, www.FahrradZukunft.de, Ausgabe 13, April 2011
A. Last, EUSTAFF 2001 – Europa in 80 Stunden, InfoBull, Heft 100, S. 29, Juli / August 2001
A. Last, Kindersitz für das Brompton, InfoBull, Heft 94, S. 28f, 2000
A. Last, Stoppt den Bromptonklau, InfoBull, Heft 93, S. 8, 2000
A. Last, Das Taschentandem, InfoBull, Heft 88, S. 15f, 1999
A. Last, Der Umbausatz zum "Liege-Brompton", ADFC-Radwelt, 1999
A. Last, Info-Clip Liegeräder, ADFC-Radwelt, 1997
A. Last, KA0536045AL Liegeraddiebstahl, was tun?, ProVelo, Heft 45, S. 34-35, Juni 1996
A. Last, HPV CD-ROM, Rezension der HPV CD-ROM von Oliver Zechlin, ProVelo, Heft 45, S. 36-37, Juni 1996
A. Last, Einladung zur zweiten Mitgliederversammlung 1996, ProVelo, Heft 45, S. 33, Juni 1996
A. Last, Wo gibt es sie?, ProVelo, Heft 43, S. 36, Dezember 1995 [Karte zur räumlichen Verteilung der HPV-Mitglieder in Deutschland]
A. Last, Unfallhergangsdatei, ProVelo, Heft 42, S. 37, September 1995
A. Last, Zur HPV-Mitgliederumfrage, ProVelo, Heft 41, S. 39-40, Juni 1995
A. Last, Neue Zeitmeßanlage ist einsatzbereit, ProVelo, Heft 39, S. 43, Dezember 1994
A. Last, Werner Stiffel: 5 Jahre HPV-Vorsitz, ProVelo, Heft 39, S. 36, Dezember 1994
A. Last, Kettendifferential für Mehrspurfahrzeuge, ProVelo, Heft 32, S. 36-37, März 1993

Patents and utility models:

A. Last, Röntgenlinsenanordnung, sowie Herstellungsverfahren dafür, Patent DE102017123851B4, Anmeldedatum 13.10.2017, Patentamt München
A. Last, E. Kronemann, Röntgenlinsenanordnung und Herstellungsverfahren, Patent DE102016116541A1, Anmeldedatum: 5.9.2016, Patentamt München
J. Mohr, A. Last, V. Nazmov, M. Simon, Th. Grund, J. Kenntner, Resiststruktur zur Herstellung einer röntgenoptischen Gitterstruktur, Patent WO2012055495A1, Anmeldedatum 13.10.2011, Patentamt München
A. Last, Vorrichtung zur Konzentration und/oder Kollimation eines Röntgenstrahls, Verfahren zu ihrer Herstellung und Spiralspiegeloptik für Röntgenstrahlen, Patent DE102011102446A1, Anmeldedatum 25.5.2011, Patentamt München
M. Simon, A. Last, V. Nazmov, E. Reznikova, Verfahren zur Herstellung von Mikrostrukturen, Patent DE102009019393A1, Anmeldedatum 29.4.2009, Offenlegungstag 11.11.2010, Patentamt München
A. Last, Kinderwagen, Gebrauchsmuster DE202008009473U1, Anmeldedatum 15.7.2008, Patentamt München
Chr. Solf, A. Last, Mikropositioniersystem, Patent DE102005018955A1, Anmeldedatum 23.4.2005, Patentamt München
A. Last, Optischer Sensorkopf, Patent DE10354730A1, Anmeldedatum 22.11.2003, Offenlegungstag 30.6.2005, Patentamt München
A. Last, C. J. Moran-Iglesias, Chr. Solf, Absorbermaske für die lithographische Strukturierung von Beugungsgittern und Verfahren zu ihrer Herstellung, Patent DE102005002434A1, Anmeldedatum 19.1.2005, Offenlegungstag 25.8.2005, Patentamt München
A. Last, Tragbarer Drucker mit rotierendem Druckkopf, Gebrauchsmuster DE20318595U1, Anmeldedatum 2.12.2003, Patentamt München
A. Last, Klappdeckel für optische hohe Wellenleiter-Strukturen, Gebrauchsmuster DE20300841U1, Anmeldedatum 21.1.2003, Patentamt München
A. Last, Biegeschablone zum Biegen der Anschlußdrähte eines elektronischen Bauteils, Patent DE19825551C1, Anmeldedatum 8.6.1998, Veröffentlichungstag der Patenterteilung 20.4.2000, Patentamt München

Occupational publications:

E. Kisiel, I. Poudyal, P. Kenesei, M. Engbretson, A. Last, R. Basak, I. Zaluzhnyy, U. Goteti, R. Dynes, A. Miceli, A. Frano, Z. Islam, Direct detection system for full-field nanoscale X-ray diffraction-contrast imaging, Optics Express 27683, vol. 32, no. 16 (2024), doi: 10.1364/OE.518974
M. Richter, Th. Beckenbach, C. Rauch, St. Schreiner, M. Zuber, E. Hamann, A. Last, M. Börner, J. Korvink, P. Meyer, Stabilizing high aspect ratio x-ray gratings with top layer resist grid, J. Micro/Nanopattern. Mater. Metrol., 23(1), 014901 (2024), doi: 10.1117/1.JMM.23.1.014901
E. Kisiel, I. Poudyal, P. Kenesei, M. Engbretson, A. Last, R. Basak, I. Zaluzhnyy, U. Goteti, R. Dynes, A. Miceli, A. Frano, Z. Islam, Full-Field Nanoscale X-ray Diffraction-Contrast Imaging using Direct Detection, (2023), 10.48550/arXiv.2212.07303
P. Zangi, K. Ikematsu, P. Meyer, H. Takano, Y. Wu, J. Gutekunst, M. Börner, A. Last, J. G. Korvink, and A. Momose, Parabolic gratings enhance the X-ray sensitivity of Talbot interferograms, Scientific Reports, vol. 13, article nr. 9624 (2023), doi: 10.1038/s41598-023-36414-8
I. Poudyal, Z. Qiao, A. Last, M. R. Armstrong, Z. Islam, Pump-probe Dark-field X-ray Microscopy, arXiv preprint arXiv:2210.06243 [cond-mat.mtrl-sci], (2022), doi: 10.48550/arXiv.2210.06243
N. Vitoratou, L. Bobb, G. Rehm, A. Last, X-ray pinhole camera spatial resolution using high aspect ratio LIGA pinhole apertures, 11th Int. Beam Instrum. Conf. IBIC2022, Kraków, Poland JACoW Publishing, ISBN: 978-3-95450-241-7, ISSN: 2673-5350, (2022), doi: 10.18429/JACoW-IBIC2022-MOP18
B. Marx-Glowna, B. Grabiger, R. Lötzsch, I. Uschmann, A. T. Schmitt, K. S. Schulze, A. Last, T. Roth, S. Antipov, H.-P. Schlenvoigt, I. Sergueev, O. Leupold, R. Röhlsberger and G. G. Paulus, Scanning high-sensitive x-ray polarization microscopy, New J. Phys. 24, 053051, (2022), doi 10.1088/1367-2630/ac6e80
M. Richter, Th. Beckenbach, H. Daerr, S. Prevrhal, M. Boerner, J. Gutekunst, P. Zangi, A. Last, J. Korvink, P. Meyer, Investigation on the mechanical interface stability of curved high aspect ratio X-ray gratings made by deep X-ray lithography, Journal of Micro/Nanopatterning, Materials and Metrology, SPIE, vol. 21, nr. 2, 024901 (2022), doi: 10.1117/1.JMM.21.2.024901
A. Opolka, D. Müller, Chr. Fella, A. Balles, J. Mohr, A. Last, Multi lens array full-field X-ray microscopy, Applied Sciences, Vol. 11, Issue 16, p. 7234 (2021), doi: 10.3390/app11167234
T. Mamyrbayev, K. Ikematsu, H. Takano, Y. Wu, K. Kimura, P. Doll, A. Last, A. Momose and P. Meyer, Staircase array of inclined refractive multi-lenses for large field of view pixel super-resolution scanning transmission hard X-ray microscopy, J. Synchrotron Rad. 28, (2021), doi: 10.1107/S1600577521001521
Z. Qiao, X. Shi, P. Kenesei, A. Last, L. Assoufid, and Z. Islam, A large field-of-view high-resolution hard X-ray microscope using polymer optics, Rev. Sci. Instrum. 91, 113703 (2020), doi: 10.1063/5.0011961
A. Last, J. Gutekunst, A. Opolka, M. Krug, C. Schwitzke, R. Koch, J. Mohr, Liquid Compound Refractive X-ray Lens, Optics Express, Vol. 28, Issue 15, pp. 22144-22150 (2020), doi: 10.1364/OE.389058
T. Mamyrbayev, A. Opolka, A. Ershov, J. Gutekunst, P. Meyer, K. Ikematsu, A. Momose, A. Last, Development of an Array of Compound Refractive Lenses for Sub-Pixel Resolution, Large Field of View, and Time-Saving in Scanning Hard X-ray Microscopy, Appl. Sci. 2020, 10, 4132 (2020), doi: 10.3390/app10124132.
W. Jark, A. Opolka, A. Cecilia, A. Last, Zooming X-rays with a single rotation in X-ray prism zoom lenses (XPZL), Optics Express, Vol. 27, Issue 12, pp. 16781-16790 (2019), doi: 10.1364/OE.27.016781
E. Kornemann, T. Zhou, O. Márkus, A. Opolka, T. Schülli, J. Mohr, A. Last, X-ray zoom lens allows for energy scans in X-ray microscopy, Optics Express, Vol. 27, Issue 1, pp. 185-195 (2019), doi: 10.1364/OE.27.000185
O. Márkus, I. Greving, E. Kornemann, M. Storm, F. Beckmann, J. Mohr, A. Last, Optimizing illumination for full field imaging at high brilliance hard X-ray synchrotron sources, Optics Express, Vol. 26, Issue 23, pp. 30435-30443 (2018), doi: 10.1364/OE.26.030435
E. Kornemann, O. Márkus, A. Opolka, K. Sawhney, A. Cecilia, M. Hurst, T. Baumbach, A. Last, J. Mohr, Optical Characterization of an X-ray Zoom Lens, Microsc. Microanal. 24 (Suppl 2) (2018), doi: 10.1017/S1431927618013685
M.-Chr. Zdora, I. Zanette, T. Zhou, F. Koch, J. Romell, S. Sala, A. Last, Y. Ohishi, N. Hirao, Chr. Rau, T. Thibault, At-wavelength optics characterisation via X-ray speckle- and grating-based unified modulated pattern analysis, Optics Express, Vol. 26, Issue 4, pp. 4989-5004 (2018) doi: 10.1364/OE.26.004989
E. Kornemann, O. Márkus, A. Opolka, T. Zhou, I. Greving, M. Storm, C. Krywka, A. Last, and J. Mohr, Miniaturized compound refractive X-ray zoom lens, Optics Express, Vol. 25, Issue 19, pp. 22455-22466 (2017), doi: 10.1364/OE.25.022455
Chr. Fella, A. Balles, S. Zabler, A. Last, R. Hanke, Hybrid setup for micro- and nano-computed tomography in the hard x-ray range, Rev. of Scient. Instr., vol. 88, issue 12, p. 123702 (2017), doi: 10.1063/1.5011042
I. Greving, M. Ogurreck, F. Marschall, A. Last, F. Wilde, T. Dose, H. Burmester, L. Lottermoser, M. Müller, C. David and F. Beckmann, Nanotomography endstation at the P05 beamline: Status and perspectives, Journal of Physics: Conference Series, Volume 849, conference 1, 012056 (2017), doi: 10.1088/1742-6596/849/1/012056
M.-Chr. Zdora, P. Thibault, T. Zhou, F. J. Koch, J. Romell, S. Sala, A. Last, Chr. Rau, I. Zanette, X-ray phase-contrast imaging and metrology through unified modulated pattern analysis, Phys. Rev. Lett. 118, issue 20, p. 203903 (2017), doi: 10.1103/PhysRevLett.118.203903
K. M. Sowa, A. Last, and P. Korecki, Grid-enhanced X-ray coded aperture microscopy with polycapillary optics, Scientific Reports 7, article number: 44944 (2017), doi:10.1038/srep44944
F. Marschall, A. Last, M. Simon, H. Vogt, J. Mohr, Simulation of aperture-optimised refractive lenses for hard X-ray full field microscopy, Optics Express, Vol. 24, Issue 10, pp. 10880-10889 (2016), doi: 10.1364/OE.24.010880
F. J. Koch, C. Detlefs, T. J. Schröter, D. Kunka, A. Last, J. Mohr, Quantitative characterization of X-ray lenses from two fabrication techniques with grating interferometry, Opt. Express, 24 (9), 9168-77 (2016), doi: 10.1364/OE.24.009168
M. Ogurreck, J. J. do Rosario, E. W. Leib, D. Laipple, I. Greving, F. Marschall, A. Last, G. A. Schneider, T. Vossmeyer, H. Weller, F. Beckmann, M. Müller, Determination of the packing fraction in photonic glass using synchrotron radiation nanotomography, J. Synchrotron Rad., 23, 1440-1446 (2016), doi:10.1107/S1600577516012960
Chr. Krywka, A. Last, F. Marschall, O. Márkus, S. Georgi, M. Müller, J. Mohr, Polymer compound refractive lenses for hard X-ray nanofocusing, AIP conference proceedings, vol. 1764, p. 020001, (2016), doi: 10.1063/1.4961129
A. Last, O. Márkus, S. Georgi, J. Mohr, Röntgenoptische Messung des Seitenwandwinkels direktlithografischer refraktiver Röntgenlinsen, Tagungsband Mikrosystemtechnik Kongress "MEMS, Mikroselektronik, Systeme", 26.-28.10.2015, Karlsruhe, VDE, ISBN 978-3-8007-4100-7 (2015)
A. Last, M. Börner, F. Marschall, P. Meyer, M. Simon, O. Márkus, S. Georgi, J. Mohr, Auswirkungen von Reflexen an Seitenwänden von Goldabsorbern in der Röntgentiefenlithographie, Tagungsband Mikrosystemtechnik Kongress "MEMS, Mikroselektronik, Systeme", 26.-28.10.2015, Karlsruhe, VDE, ISBN 978-3-8007-4100-7 (2015)
F. Koch, F. Marschall, J. Meiser, O. Márkus, A. Faisal, T. Schröter, P. Meyer, D. Kunka, A. Last, J. Mohr, Increasing the Aperture of X-ray Mosaic Lenses by Freeze Drying, Journal of Micromech. Microeng., volume 25, 075015, (2015), doi:10.1088/0960-1317/25/7/075015
V. Nazmov, M. Kluge, A. Last, F. Marschall, J. Mohr, H. Vogt, R. Simon, LIGA micro-openings for coherence characterization of X-rays, Microsystem Technologies, Volume 20, Issue 10-11, S. 2031-2036, (2014), doi: 10.1007/s00542-013-2056-9
J. Hilhorst, F. Marschall, T. N. Tran Thi, A. Last, T. U. Schülli, Full-field X-ray diffraction microscopy using polymeric compound refractive lenses, Journal of Applied Crystallography 47, S. 1882-1888, (2014), doi:10.1107/S1600576714021256
F. Marschall, A. Last, M. Simon, M. Kluge, V. Nazmov, H. Vogt, M. Ogurreck, I. Greving, J. Mohr, X-ray Full Field Microscopy at 30 keV, Journal of Physics: Conference Series (JPCS), 499, S. 012007 f., (2014)
H. Vogt, A. Last, J. Mohr, F. Marschall, K.-U. Mettendorf, R. Eisenhower and M. Simon, Low-cost Rolled X-ray Prism Lenses to increase photon flux density in diffractometry experiments, Powder Diffraction, Advances in X-ray Analysis, Volume 57, proceedings of the 2013 Denver X-ray Conference, verfügbar auf CJO2014 (2014), DOI:10.1017/S0885715614000177
H. Vogt, A. Last, J. Mohr, F. Marschall, M. Kluge, V. Nazmov, K.-U. Mettendorf, R. Eisenhower, Refraktive Röntgenlinsen zur Intensitätserhöhung im Spot einer Röntgenröhre, Proc. of Mikrosystemtechnik Kongress 2013, Aachen, VDE-Verlag, S. 453-456 (2013)
W. Jark, A. Last, O. Márkus, High-speed photon energy tuning of x-rays with high duty cycle by use of Clessidra prism arrays, SPIE Proceedings Vol. 8848, Advances in X-Ray/EUV Optics and Components VIII, 884806 (2013), DOI: 10.1117/12.2023921
W. Jark, A. Last, Concepts for rapid tuning and switching of x-ray energies, SPIE Proceedings vol. 8777, Damage to VUV, EUV, and X-ray Optics IV; and EUV and X-ray Optics: Synergy between Laboratory and Space III, 877712 (2013)
M. Simon, V. Altapova, T. Baumbach, M. Kluge, A. Last, F. Marschall, J. Mohr, V. Nazmov, H. Vogt, Refractive Optical Elements and Optical System for High Energy X-ray Microscopy, AIP Proceedings ICXOM21, 1437, 116 (2012), DOI: 10.1063/1.3703354
H. Vogt, M. Simon, V. P. Nazmov, A. Last, J. Mohr, Refractive x-ray condenser optics for use in microscopes with x-ray tube sources, SPIE, Optical Systems Design (2011)
F. Marschall, A. Last, J. Mohr, V. Nazmov, M. Simon, H. Vogt, Development and design on an X-ray microscope for high photonenergies based on refractive lenses, Karlsruhe Days of Optics and Photonics (KDOP), Karlsruhe (2011)
A. Last, F. Marschall, J. Mohr, V. Nazmov, M. Simon, H. Vogt, Miniaturisierte Wolter-Optiken für harte Röntgenstrahlen, Proc. of Mikrosystemtechnik Kongress 2011, Darmstadt, Deutschland, 10.10.2011, Seiten 422-424, ISBN: 978-3-8007-3367-5 (2011)
M. Simon, J. Kenntner, L. Sahlmann, T. Grund, H. Vogt, A. Last, V. Nazmov, J. Mohr, Stabilization of HARMS with a Framework out of Thin Carbon Fibers, HARMST 2011, Taiwan, 12.-18.6.2011 (2011)
V. Nazmov, A. Last, F. Marschall, J. Mohr, M. Simon, H. Vogt, A Method to Create Complementary Panels and Beams for Microstructures with Very High Aspect Ratio (Ein Verfahren zur Herstellung von funktionalen Mikrostrukturen mit sehr hohem Aspektverhältnis durch komplementäre Stützstrukturen), Proc. of Mikrosystemtechnik Kongress 2011, Darmstadt, Deutschland, 10.10.2011, Seiten 658-661, ISBN: 978-3-8007-3367-5 (2011)
H. Vogt, M. Simon, A. Last, F. Marschall, J. Mohr, V. Nazmov, R. Eisenhower, K. U. Mettendorf, X-ray refractive large aperture rolled prism lenses as condensers for X-ray tubes; Proc. SPIE 8167, Optical Design and Engineering IV (2011), DOI: 10.1117/12.897004
H. Vogt, A. Last, J. Mohr, V. Nazmov, M. Simon, R. Eisenhower, K. U. Mettendorf, Advances in the development of x-ray refractive large aperture rolled prism lenses; Proc. SPIE 8076, EUV and X-Ray Optics: Synergy between Laboratory and Space II, 80760I (2011)
M. Simon, G. Ahrens, A. Last, J. Mohr, V. Nazmov, E. Reznikova, A. Voigt, Refractive Optics for Hard X-ray Transmission Microscopy, AIP Conf. Proc. 1365, 208 (2011), DOI: 10.1063/1.3625341
A. Last, V. Nazmov, M. Simon, H. Vogt, F. Marschall, Th. Grund, J. Kenntner, J. Mohr, Refractive polymer optics and gratings for hard X-rays, 6eme Colloque Utilisateurs de SOLEIL, Palaiseau, France (2011)
M. Simon, E. Reznikova, V. Nazmov, T. Grund, A. Last, A New Type of X-ray Condenser Lenses with Large Apertures Fabricated by Rolling of Structured Films, Proceedings of the 20th International Congress X-Ray Optics and Microanalysis, Karlsruhe, ISBN 978-0-7354-0764-0, p. 85-90, 15.-18.9.2009 (2010)
A. Haibel, M. Ogurreck, F. Beckmann, T. Dose, F. Wilde, J. Herzen, M. Müller, A. Schreyer, V. Nazmov, M. Simon, A. Last, and J. Mohr, Micro and Nano Tomography at the GKSS Imaging Beamline at PETRA III, Proceedings of SPIE Optics and Photonics, Developments in X-Ray Tomography VII, San Diego (2010)
M. Simon, V. Nazmov, E. Reznikova, A. Last, J. Mohr, P.-J. Jakobs, V. Saile, O. Bunk, C. Kewish, Refractive X-ray optics made from polymer microstructures; Proc. SPIE 7716 (2010), DOI: 10.1117/12.858894
A. Last, Refractive X-Ray Lenses Produced by X-Ray Lithography, in LIGA and Its Applications (eds V. Saile, U. Wallrabe, O. Tabata, J. G. Korvink), Wiley-VCH (2009), DOI: 10.1002/9783527622573.ch9
Y. Jourlin, S. Tonchev, A. V. Tishchenko, C. Pedri, C. Veillas, O. Parriaux, A. Last, Y. Lacroute, Spatially and polarization resolved plasmon mediated transmission through continuous metal films, Optics Express, vol. 17, issue 14, pp. 12155 - 12166 (2009)
S. Eve, N. Huber, A. Last, O. Kraft, Fatigue behavior of thin Au and Al films on polycarbonate and polymethylmethacrylate for micro-optical components, Thin Solid Films, volume 517, issue 8, pp. 2702 - 2707 (2009)
V. Nazmov, E. Reznikova, A. Last, V. Saile; Highly efficient 2-D nano focusing by optical system of planar refractive lenses; 9th International Conference on X-Ray Microscopy, J. Phys.: Conf. Ser. 186 012069, DOI:10.1088/1742-6596/186/1/012069 (2009)
E. Reznikova, T. Weitkamp, V. Nazmov, M. Simon, A. Last, V. Saile; Transmission hard X-ray microscope with increased view field using planar refractive objectives and condensers made of SU-8 polymer; J. Phys.: Conf. Ser. 186, 012070 (2009)
M. Simon, E. Reznikova, V. Nazmov, M. Umbach, A. Last, Testing of X-ray prism lenses; Proc. SPIE 7100 (2008), DOI: 10.1117/12.797885
V. Saile, U. Wallrabe, O. Tabata; LIGA and its Applications; Kapitel "X-ray Lenses" von A. Last; Wiley-VCH, 480, 3-527-31698-1, 7 (2008)
M. Umbach, M. Simon, V. Nazmov, V. Saile, A. Last, Achromatic x-ray focusing using diffractive and refractive elements; Proc. SPIE 7100 (2008)
V. Nazmov, E. Reznikova, A. Last, M. Boerner, J. Mohr; Reflectivity test of X-ray mirrors for deep X-ray lithography; Microsystem Technologies, 1299-1303, Vol. 14 (2008)
A. Last, V. Nazmov, E. Reznikova, V. Saile; Röntgenoptiken; FZK-Nachrichten (2008)
C. Debaes, J. Van Erps, M. Karppinnen, J. Hiltunen, H. Suyal, A. Last, M. G. Lee, K. Pentti, M. Taghizadeh, J. Mohr, H. Thienpont, A. Glebov; Fabrication method to create high-aspect ratio pillars for photonic coupling of board level interconnects; SPIE Proceedings Series, 6992, S.69920T/1-12, ISBN 978-0-8194-7190-1 (2008)
M. Umbach, V. Nazmov, E. Reznikova, M. Simon, A. Last, V. Saile; Focussing an X-ray energy range using a compound of refractive elements; Optical Systems Design; SPIE2008 Europe, 1.-5.9.2008 (2008)
E. Reznikova, R. Simon, V. Nazmov, M. Simon, A. Last, V. Saile; Transmission hard X-ray microscope using planar crossed SU-8 parabolic objective and condenser; Advances in X-ray / EUV Optics and Components III; SPIE2008, 10.-14.08.2008 (2008)
M. Umbach, V. Nazmov, E. Reznikova, M. Simon, A. Last, V. Saile; Numerical simulations of achromatic X-ray lenses; Advances in X-ray / EUV Optics and Components III; SPIE 2008, 10.-14.08.2008 (2008)
V. Nazmov, E. Reznikova, Y.-L. Mathis, J. Mathuni, A. Müller, P. Rudych, A. Last, V. Saile; Bandpass Filters made by LIGA for the THz Region: Manufactoring and Testing; Nucl. Instr. Meth., A603, S. 150 (2008)
E. Reznikova, R. Simon, T. Weitkamp, V. Nazmov, M. Simon, A. Last, V. Saile; Transmission hard X-ray nanoscope with field of view of 100 x 100 µm² using planar refractive SU-8 Objectives and Condensers; 17th Internat. Synchrotron Radiation Conf. (SR-2008), 15.-20.6.2008 (2008)
M. Simon, E. Reznikova, V. Nazmov, A. Last; Measurement of Side Walls of High Aspect Ratio Microstructures; Microsystem Technologies, Volume 14, Issue 9-11, S. 1727-1729, (2008), DOI: 10.1007/s00542-008-0618-z
M. Simon, E. Reznikova, V. Nazmov, A. Last, W. Jark; X-ray Prism Lenses with large Apertures; Advances in X-ray / EUV Optics and Components III; SPIE Proceedings, 7077, 70771Q (2008)
V. Nazmov, E. Reznikova, A. Last, M. Börner, J. Mohr; Reflectivity test of X-ray mirrors for deep X-ray lithography; HARMST 2007 Conference; Microsystem Technologies, Vol. 14, Issue 9-11, S. 1299-1303 (2008), DOI: 10.1007/s00542-008-0581-8
V. Nazmov, E. Reznikova, A. Last, J. Mohr, V. Saile, M. DiMichiel, J. Göttert, Crossed planar X-ray lenses made from nickel for X-ray micro focusing and imaging applications.; Nuclear Instruments and Methods in Physics Research A, 39306, S.120-122, 582 (2007), DOI: 10.1016/j.nima.2007.08.076
V. Nazmov, E. Reznikova, A. Last, J. Mohr, V. Saile, R. Simon, and M. DiMichiel, X-ray Lenses Fabricated by LIGA Technology, AIP Conf. Proc. 879, 770 (2007), DOI:10.1063/1.2436174
K. Bade, M. Börner, P. J. Jakobs, A. Last, T. Mappes, J. Mohr, P. Meyer, V. Nazmov, F. J. Pantenburg, E. Reznikova, V. Saile, J. Schulz, M. Simon, Research activities in the LIGA laboratory at ANKA.; ANKA - Annual Report 2007, 2007, S.129-137 (2007)
A. Last, V. Nazmov, E. Reznikova; Planare refraktive Röntgenlinsen - Gebündeltes Röntgenlicht; Physik in unserer Zeit, published online: 26.7.2007, S. 176-183, ISSN 0031-9252, Vol. 38, Issue 4 (2007), DOI: 10.1002/piuz.200601139
A. Last, E. Reznikova, V. Nazmov, M. Simon; SU-8 als Material für die Fertigung hochpräziser LIGA-Röntgenlinsen; VDE/VDI-Gesellschaft Mikroelektronik, Mikro- und Feinwerktechnik, GMM-Workshop Technologien und Werkstoffe der Mikro- und Nanosystemtechnik, 7.-8.5.2007, 264, ISBN 987-3-8007-3033-9 (2007)
V. Nazmov, E. Reznikova, A. Last, J. Mohr, V. Saile, M. DiMichiel, J. Göttert; LIGA Fabrication of X-ray Nickel Lenses; 14th Nat.Conf.on Synchrotron Radiation Instrumentation (SRI2007), 25.-27.4.2007 (2007)
V. Nazmov, E. Reznikova, A. Last, J. Mohr, V. Saile, M. DiMichiel, J. Göttert; Crossed planar X-ray lenses of Ni for micro focusing and imaging; Nuclear Instruments and Methods in Physics Research Section A, Accelerators Spectrometers Detectors and Associated Equipment, Vol. 582, S. 120-122 (2007), DOI:10.1016/j.nima.2007.08.076
E. Reznikova, V. Nazmov, A. Last, V. Saile, R. Simon, T. Weitkamp, H. Riesemeier; Phase contrast hard X-ray microsopy using SU-8 refractive lenses; XMNP2007, Workshop on "X-ray Micro and Nanoprobes: Instruments, Methodologies and Applications", 11.-17.6.2007 (2007)
A. Last; Refraktive Röntgenlinsen; r2b, 39267 (2007)
E. Reznikova, R. Simon, V. Nazmov, M. Simon, A. Last, V. Saile; Transmission hard X-ray microscope using planar crossed SU-8 parabolic objective and condenser; 6th ANKA-Usermeeting 2007, 1.-2.10.2007 (2007)
V. Nazmov, R. Simon, E. Reznikova, A. Last; Express Measurement of Coherence Field of Hard X-Rays; 6th ANKA-Usermeeting 2007, 1.-2.10.2007 (2007)
A. Last; Refractive X-ray lenses; 6th ANKA-Usermeeting 2007, 1.-2.10.2007 (2007)
A. Last, V. Nazmov, E. Reznikova, M. Simon, M. Umbach, V. Saile; Refraktive Röntgenlinsen; PRORA 2007, Fachtagung Roentgenanalytik, 15.-16.11.2007 (2007)
E. Reznikova, T. Weitkamp, V. Nazmov, A. Last, M. Simon, V. Saile; Investigation of phase contrast hard X-ray microscopy using planar sets of refractive crossed linear parabolic lenses made from SU-8 polymer; Physica Status Solidi, S. 2811-2816, Vol. 204, No. 8 (2007), DOI: 10.1002/pssa.200675690
E. Reznikova, T. Weitkamp, V. Nazmov, A. Last, M. Simon, V. Saile; Investigation of phase contrast hard X-Ray microscopy using planar sets of refractive crossed linear parabolic lenses made from SU-8 polymer; 8th Bienneal Conf. on High Resolution X-Ray Diffraction and Imaging (XTOP 2006), Book of Abstracts, 19.-22.9.2006, S. 198 (2006)
C.-J. Moran-Iglesias, A. Last, J. Mohr, Großflächige quasi freistrahloptische Mikrospektrometer, Forschungszentrum Karlsruhe GmbH, Wissenschaftlicher Bericht Nr. FZKA-7211, ISSN 0947-8620 (2006)
S. Eve, N. Huber, E. Ernst, A. Last, M. Schlagenhof, O. Kraft, Biaxial Fatigue Testing of Thin Films, AIP Conference Proceedings 817, 92 (2006), DOI: 10.1063/1.2173536
Y. Jourlin, E. Gamet, S. Tonchev, A. V. Tishchenko, O. Parriaux, A. Last, Low loss polarizing beam splitter using the long range plasmon mode along a continuous metal film, SPIE Proceedings, Photon Management II; volume 61870H (2006), DOI: 10.1117/12.668364
Y. Jourlin, O. Parriaux, S. Reynaud, J. C. Pommier, M. Johnson, A. Last, M. Guttmann, A new wireless and miniaturized high-resolution optical displacement sensor, Optical Micro- and Nanometrology in Microsystems Technology, Proceedings volume 61881B (2006), DOI: 10.1117/12.661913
D. Blanc, A. Last, J. Franc, S. Pavanc, J.-L. Loubetc, Hard UV-curable organo-mineral coatings for optical applications, Thin Solid Films, volume 515, issue 3, 23 November 2006, pages 942-946 (2006)
J. Franc, N. Destouches, D. Blanc, J.-C. Pommier, S. Tonchev, G. Van Steenberge, N. Hendrickx, A. Last, O. Parriaux, High-efficiency diffraction grating coupler for multimode optical interconnect, Proc. SPIE 6185, Micro-Optics, VCSELs, and Photonic Interconnects II: Fabrication, Packaging, and Integration, 61851F (2006); DOI:10.1117/12.666710
V. Nazmov, E. Reznikova, A. Last, J. Mohr, V. Saile; Planar refractive lenses for hard X-ray micro spectroscopy and imaging; SNI 2006, Deutsche Tagung für Forschung mit Synchrotronstrahlung, Neutronen und Ionenstrahlen an Großgeräten, 04.-06.10.2006 (2006)
E. Reznikova, V. Nazmov, A. Last, M. Simon, V. Saile, R. Simon, T. Weitkamp; Phase contrast hard X-ray microscope with use of planar refractive crossed linear parabolic SU-8 lenses; 16th Internat. Synchrotron Radiation Conf. (SR-2006), 10-15.7.2006 (2006)
D. Blanc, A. Last, J. Franc, S. Pavan, J.-L. Loubet; Hard UV-curable organo-mineral coatings for optical applications; thin solid films, 942-946, 0040-6090, 515 (2006), DOI: 10.1016/j.tsf.2006.07.177
S. Eve, N. Huber, O. Kraft, A. Last, D. Rabus, M. Schlagenhof; Development and validation of an experimental setup for the biaxial fatigue testing of metal thin films; review of scientific instruments, 0034-6748, 77, issue 10, Article Number: 103902 (2006), DOI: 10.1063/1.2357313
J. Franc, D. Blanc, A. Zerroukhi, Y. Chalamet, A. Last, N. Destouches; Organo-silica-titania nanocomposite elaborated by sol-gel processing with tunable optical properties; materials science and engineering B - solid state materials for advanced technology, 180-185, 0921-5107, 129, Issue: 1-3 (2006), DOI: 10.1016/j.mseb.2006.01.011
F. Berghmans, M. Van Uffelen, S. Eve, E. Ernst, A. Last, D. Rabus, N. Huber, O. Kraft, A. Andrei, L. Nieradko, K. Krupa, M. Jozwik, C. Gorecki, L. Hirsinger, P. Delobelle, P. Kniazewski, L. Salbut, and M. Kujawinska "Reliability studies of micro-optical components in NEMO", Proc. SPIE 6193, Reliability of Optical Fiber Components, Devices, Systems, and Networks III, 61930A (9 May 2006); DOI: 10.1117/12.662001
P. Lücke, A. Last, J. Mohr, Mikrooptische Sensoren nach dem chromatisch konfokalen Messprinzip, Forschungszentrum Karlsruhe GmbH, Wissenschaftlicher Bericht Nr. FZKA-7234, ISSN 0947-8620 (2006)
C. J. Moran-Iglesias, A. Last, J. Mohr, Improved grating microspectrometer, SPIE Proceedings, Optical Design and Engineering II, volume 5962 25 (2005), DOI: 10.1117/12.625169
A. K. Ruprecht, Ch. Pruss, H. J. Tiziani, W. Osten, P. Lücke, A. Last, J. Mohr, P. Lehmann, Confocal micro-optical distance sensor: principle and design, Proc. SPIE 5856, 128 (2005), doi:10.1117/12.612008
P. Lücke, A. Last, J. Mohr, A. K. Ruprecht, Ch. Pruss, H. J. Tiziani, W. Osten, P. Lehmann and S. Schonfelder, Confocal micro-optical distance sensor: realization and results, Proc. SPIE 5856, 136 (2005), doi:10.1117/12.612418
J. Mohr, A. Last, U. Wallrabe, Modular Fabrication Concept for LIGA-Based Microoptics, in Microoptics: From Technology to Applications (eds: J. Jahns, K.-H. Brenner), Springer Series in Optical Sciences, Vol 97, S. 113-126., ISBN 0-387-20980-8, (2004)
T. Mappes, S. Achenbach, A. Last, J. Mohr, R. Truckenmuller; Evaluation of optical qualities of a LIGA-spectrometer in SU-8; Microsystem Technologies, 560-563, 10, Issue: 6-7 (2004), DOI: 10.1007/s00542-004-0403-6, 0946-7076
P. Lücke, A. Last, J. Mohr, A. Ruprecht, W. Osten, H. J. Tiziani, P. Lehmann, Confocal micro-optical distance sensor for precision metrology, Optical Sensing, edited by B. Culshaw, A. G. Mignani; R. Riesenberg, Proceedings of the SPIE, Vol. 5459, pp. 180-184 (2004), DOI: 10.1117/12.545404
G. M. Morris, J. Jahns, K.-H. Brenner, Microoptics - from technology to applications, 6.Micro-optical components and systems based on polymers, J. Mohr, A. Last, U. Wallrabe (2004)
J. Mohr, U. Hollenbach, A. Last, U. Wallrabe, Polymer technologies: a way to low-cost micro-optical components and systems, Micro-Optics, VCSELs, and Photonic Interconnects, edited by H. Thienpont, K. D. Choquette, M. R. Taghizadeh, Proc. of SPIE Vol. 5453 (2004), DOI: 10.1117/12.554937
A. Last, J. Mohr, Fehllicht in LIGA-Mikrospektrometern, Forschungszentrum Karlsruhe GmbH, Wissenschaftlicher Bericht Nr. FZKA-6585, ISSN 0947-8620 (2003)
A. Last, H. Hein, J. Mohr; Shape deviations in masks for optical structures produced by electron beam lithography; microsystem technologies - micro- and nanosystems-information storage and processing systems, 10, S. 527-530, Issue: 6-11 (2003), DOI: 10.1007/s00542-004-0386-3, 0946-7076
J. Mohr, A. Last, U. Hollenbach, T. Oka, U. Wallrabe, A modular fabrication concept for microoptical systems, Journal of Lightwave Technolgy, 0733-8724, 21, Nr. 3, S.643-647 (2003), DOI: 10.1109/JLT.2003.809578
U. Wallrabe, H.Dittrich, U. Hollenbach, P. Krippner, A. Last, J. Mohr, A. Ruzzu, W. Zissler, T. Oka, Mikrooptik: Querschnittstechnologie für die Telekommunikation und Sensorik (Micro-optics: A technology that spans telecommunications and sensors), Galvanotechnik, Leuze-Verlag, Vol. 94, No 3, S. 698-703, ISSN 0016-4232 (2003)
J. Mohr, U. Hollenbach, A. Last, U. Wallrabe, Microoptics made by LIGA Technology, Vortrag, 5. Biennial Workshop HARMST 2003, Monterey, California, USA, S. 169-170 (2003)
A. Last, J. Mohr, Fehllicht in LIGA-Mikrospektrometern, Forschungszentrum Karlsruhe GmbH, Wissenschaftlicher Bericht Nr. FZKA-6585, ISSN 0947-8620 (2003)
A. Last, Fehllicht in LIGA-Mikrospektrometern, Dissertation Universität Karlsruhe (2003)
J. Mohr, A. Last, U. Hollenbach, T. Oka, U. Wallrabe: A Modular Fabrication Concept for Micro Optical Systems, J. Lightwave Technol. 21, 643- (2003)
A. Last, H. Hein, J. Mohr, Deviations in Absorber Shape of Electron Beam Lithography using the Example of LIGA-Microspectrometers, International Conference on Optical MEMs, Lugano, Conference Digest: IEEE Catalog Number 02EX610 (ISBN 0-7803-7595-5) (2002), DOI: 10.1109/OMEMS.2002.1031465
A. Last, Mikrospektrometer: Viel Farbe aus wenig Licht, Physik in unserer Zeit, Wiley-VCH, Vol. 33, Issue 2, S. 56-59 (2002), DOI: 10.1002/1521-3943(200203)33:2<56::AID-PIUZ56>3.0.CO;2-F
U. Wallrabe, H. Dittrich, U. Hollenbach, P. Krippner, A. Last, J. Mohr, A. Ruzzu, W. Zissler, T. Oka, Mikro-Optik: Querschnitts-Technologie für die Telekommunikation und Sensorik, Nachrichten - Forschungszentrum Karlsruhe, 34, S.153-159 (2002)
J. Mohr, A. Last, U. Wallrabe, Free Space Optical Components Based on LIGA Technology, 8th Microoptics Conference (MOC ‘01) Technical Digest, Osaka Japan, The Japan Society of Applied Physics, S. 106-111 (2001)
J. Mohr, A. Last, U. Hollenbach, T. Oka, U. Wallrabe, A Modular Fabrication Concept for Micro Optical Systems (Poster), Workshop: Optical MEMS and Integrated Optics, Uni Dortmund, FZK-Veröffentlichungsnummer K 1117 (2001)
P. Krippner, T. Kühner, A. Last, J. Mohr, S. Schönfelder, Kommerzielle Produkte auf der Basis des LIGA-Mikrospektrometers. 4. Statuskolloquium des Programms Mikrosystemtechnik, Karlsruhe, 30.-31.3.2000, Wissenschaftliche Berichte, FZKA-6423 S.217-18 (2000)
P. Krippner, T. Kühner, A. Last, J. Mohr, S. Schönfelder, Kommerzielle Produkte auf der Basis der LIGA-Technik, 4. Statuskolloquium des PMT, FZK-Veröffentlichungsnummer K 1062, Bericht des Forschungszentrum Karlsruhe (2000)
T. Kühner, P. Krippner, S. Oppermann, A. Last, J. Mohr, P. Wicht, Weiterentwicklung von Spektrometersystemen für den NIR-Bereich, 4. Statuskolloquium des Programms Mikrosystemtechnik, Karlsruhe, 30.-31.3.2000, Wissenschaftliche Berichte, FZKA-6423, S. 219-220 (2000)
A. Last, Diplomarbeit "Optische Absorptionspektren solvatisierter Elektronen in polaren Medien", Institut für Physikalische Chemie und Elektrochemie, Lehrstuhl III der Universität Karlsruhe, (1993)